RODOLFO ARANEO

Rodolfo Araneo (S'99, M'03, SM'09, F'25) received the M.S. (summa cum laude) and PhD degrees in electrical engineering from the University of Rome "La Sapienza," Rome, Italy, in 1999 and 2002, respectively. In 1999, he was a Visiting Student at the National Institute of Standards and Technology (NIST) in Boulder, CO, USA, where he worked on TEM cells and shielding. The same year, he received the Past President's Memorial Award from the IEEE Electromagnetic Compatibility Society. In 2000, he was a Visiting Researcher in the Department of Electrical and Computer Engineering at the University of Missouri-Rolla (UMR), Rolla, MO, USA, where he worked on printed circuit boards and finite-difference time-domain techniques.
He is a Full Professor with the DIAEE at the University of Rome La Sapienza. He has authored more than 220 papers in international journals and conference proceedings.
He is the co-author of the books "Electromagnetic Shielding" (IEEE Wiley 2008), "Electrical Safety Engineering of Renewable Energy Systems" (IEEE Wiley 2021), "Advanced Time Domain Modelling for Electrical Engineering (The Institution of Engineering and Technology - IET), and Electromagnetic Shielding: Theory and Applications, John Wiley & Sons.
He serves as a Reviewer for several international journals.
In 2018, he was nominated as a Fellow of the Applied Computational Electromagnetics Society (ACES).
In 2025, he was nominated as an IEEE Fellow "for contributions to electromagnetic shielding and EMC design of grid-scale photovoltaic plants."
Since 2015, he has been the general chair of the IEEE International Conference on Environment and Electrical Engineering.
His research interests include electromagnetic compatibility, energy harvesting, renewable energy, piezotronics based on piezoelectric ZnO nanostructures, graphene electrodynamics, and the development of numerical and analytical techniques for modelling high-speed printed circuit boards, shielding, transmission lines, periodic structures, and graphene-based devices.